The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

Call for competition published on TED on 15 Oct 2026 by Danmarks Tekniske Universitet - DTU (Denmark), CPV 38511100 Scanning electron microscopes. Tenders are accepted until 16 Nov 2026.

Notice	713490-2026 (cn-standard)
Status	Open tender
Published	15 Oct 2026
Buyer	Danmarks Tekniske Universitet - DTU, Kgs. Lyngby
Country	Denmark
Main CPV	38511100-1 Scanning electron microscopes
Contract type	supplies
Procedure	open
Deadline for tenders	16 Nov 2026 07:00

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Open on TED Tender documents

Description

DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.

Lots (1)

Lot	Title	Estimated value	Deadline
LOT-0000	The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source		16 Nov 2026

Other CPV codes

38511000 Electron microscopes
38512100 Ion microscopes

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