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Metrology SEM+FIB system

Title in Dutch as published on TED.

Contract award notice published on TED on 3 Nov 2026 by Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO (Netherlands), CPV 31712000 Microelectronic machinery and apparatus and microsystems. Awarded to Carl Zeiss B.V. for EUR 825,000.

Notice763749-2026 (can-standard)
StatusContract award
Published3 Nov 2026
BuyerNederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO, Den Haag
CountryNetherlands
Main CPV31712000-0 Microelectronic machinery and apparatus and microsystems
Contract typesupplies
Procedureopen
Estimated valueEUR 1,300,000 excl. VAT
Awarded valueEUR 825,000
Tenders received2
Award decision26 Oct 2026

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Basic $19 a month, up to 5 filters. Pro $49 a month, up to 30 filters and tenders closing within 5 days. Charged in UAH at the National Bank of Ukraine rate on the payment day.

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Description

The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem

Lots (1)

LotTitleEstimated valueDeadline
LOT-0000Metal Lift-Off System (TNO44)

Winners

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Basic $19 a month, up to 5 filters. Pro $49 a month, up to 30 filters and tenders closing within 5 days. Charged in UAH at the National Bank of Ukraine rate on the payment day.